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Surface Detection of Strain-Relaxed Si1-xGex Alloys With High Ge-Content by Optical Second-Harmonic Generation
Ji-Hong Zhao; Chun-Hao Li; Qi-Dai Chen; Bu-Wen Cheng; Hong-Bo Sun
2015
Source PublicationIEEE JOURNAL OF QUANTUM ELECTRONICS
Volume51Issue:12Pages:7000606
Subject Area光电子学
Indexed BySCI
Date Available2016-03-22
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26679
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Ji-Hong Zhao,Chun-Hao Li,Qi-Dai Chen,et al. Surface Detection of Strain-Relaxed Si1-xGex Alloys With High Ge-Content by Optical Second-Harmonic Generation[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS,2015,51(12):7000606.
APA Ji-Hong Zhao,Chun-Hao Li,Qi-Dai Chen,Bu-Wen Cheng,&Hong-Bo Sun.(2015).Surface Detection of Strain-Relaxed Si1-xGex Alloys With High Ge-Content by Optical Second-Harmonic Generation.IEEE JOURNAL OF QUANTUM ELECTRONICS,51(12),7000606.
MLA Ji-Hong Zhao,et al."Surface Detection of Strain-Relaxed Si1-xGex Alloys With High Ge-Content by Optical Second-Harmonic Generation".IEEE JOURNAL OF QUANTUM ELECTRONICS 51.12(2015):7000606.
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