SEMI OpenIR  > 半导体超晶格国家重点实验室
Raman identification of edge alignment of bilayer graphene down to the nanometer scale
Zhang, X; Li, QQ; Han, WP; Lu, Y; Shi, W; Wu, JB; Mikhaylushkin, AS; Tan, PH
2014
Source PublicationNANOSCALE
Volume6Issue:13Pages:7519-7525
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2015-05-11
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26438
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Zhang, X,Li, QQ,Han, WP,et al. Raman identification of edge alignment of bilayer graphene down to the nanometer scale[J]. NANOSCALE,2014,6(13):7519-7525.
APA Zhang, X.,Li, QQ.,Han, WP.,Lu, Y.,Shi, W.,...&Tan, PH.(2014).Raman identification of edge alignment of bilayer graphene down to the nanometer scale.NANOSCALE,6(13),7519-7525.
MLA Zhang, X,et al."Raman identification of edge alignment of bilayer graphene down to the nanometer scale".NANOSCALE 6.13(2014):7519-7525.
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