Knowledge Management System Of Institute of Semiconductors,CAS
Statistical properties of exciton fine structure splitting and polarization angles in quantum dot ensembles | |
Gong, M; Hofer, B; Zallo, E; Trotta, R; Luo, JW; Schmidt, OG; Zhang, CW | |
2014 | |
Source Publication | PHYSICAL REVIEW B
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Volume | 89Issue:20Pages:205312 |
Subject Area | 半导体物理 |
Indexed By | SCI |
Language | 英语 |
Date Available | 2015-03-25 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/26272 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | Gong, M,Hofer, B,Zallo, E,et al. Statistical properties of exciton fine structure splitting and polarization angles in quantum dot ensembles[J]. PHYSICAL REVIEW B,2014,89(20):205312. |
APA | Gong, M.,Hofer, B.,Zallo, E.,Trotta, R.,Luo, JW.,...&Zhang, CW.(2014).Statistical properties of exciton fine structure splitting and polarization angles in quantum dot ensembles.PHYSICAL REVIEW B,89(20),205312. |
MLA | Gong, M,et al."Statistical properties of exciton fine structure splitting and polarization angles in quantum dot ensembles".PHYSICAL REVIEW B 89.20(2014):205312. |
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