SEMI OpenIR  > 半导体超晶格国家重点实验室
What has been measured by reflection magnetic circular dichroism in Ga1-xMnxAs/GaAs structures?
He, ZX; Zheng, HZ; Huang, XJ; Wang, HL; Zhao, JH
2014
Source PublicationCHINESE PHYSICS B
Volume23Issue:7Pages:077801
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2015-03-25
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26264
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
He, ZX,Zheng, HZ,Huang, XJ,et al. What has been measured by reflection magnetic circular dichroism in Ga1-xMnxAs/GaAs structures?[J]. CHINESE PHYSICS B,2014,23(7):077801.
APA He, ZX,Zheng, HZ,Huang, XJ,Wang, HL,&Zhao, JH.(2014).What has been measured by reflection magnetic circular dichroism in Ga1-xMnxAs/GaAs structures?.CHINESE PHYSICS B,23(7),077801.
MLA He, ZX,et al."What has been measured by reflection magnetic circular dichroism in Ga1-xMnxAs/GaAs structures?".CHINESE PHYSICS B 23.7(2014):077801.
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