SEMI OpenIR  > 中科院半导体照明研发中心
Characterization of nitride-based LED materials and devices using TOF-SIMS
Wei, Xuecheng; Zhao, Lixia; Wang, Junxi; Zeng, Yiping; Li, Jinmin
2014
Source PublicationSURFACE AND INTERFACE ANALYSIS
Volume46Pages:299-302
Subject Area半导体器件
Indexed BySCI
Language英语
Date Available2015-03-20
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26090
Collection中科院半导体照明研发中心
Recommended Citation
GB/T 7714
Wei, Xuecheng,Zhao, Lixia,Wang, Junxi,et al. Characterization of nitride-based LED materials and devices using TOF-SIMS[J]. SURFACE AND INTERFACE ANALYSIS,2014,46:299-302.
APA Wei, Xuecheng,Zhao, Lixia,Wang, Junxi,Zeng, Yiping,&Li, Jinmin.(2014).Characterization of nitride-based LED materials and devices using TOF-SIMS.SURFACE AND INTERFACE ANALYSIS,46,299-302.
MLA Wei, Xuecheng,et al."Characterization of nitride-based LED materials and devices using TOF-SIMS".SURFACE AND INTERFACE ANALYSIS 46(2014):299-302.
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