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Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography
Qiao, YB; Feng, SW; Xiong, C; Zhu, H
2014
Source PublicationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume14Issue:1Pages:413-417
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2015-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/25951
Collection光电子器件国家工程中心
Recommended Citation
GB/T 7714
Qiao, YB,Feng, SW,Xiong, C,et al. Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,2014,14(1):413-417.
APA Qiao, YB,Feng, SW,Xiong, C,&Zhu, H.(2014).Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,14(1),413-417.
MLA Qiao, YB,et al."Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography".IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 14.1(2014):413-417.
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