| Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions | |
| Jiang, Yu; Ma, Xunpeng; Xu, Yun; Song, Guofeng | |
| 2014 | |
| Source Publication | JOURNAL OF APPLIED PHYSICS
 |
| Volume | 116Issue:17Pages:173702 |
| Subject Area | 半导体材料 |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2015-03-01 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/25950 |
| Collection | 纳米光电子实验室 |
| Recommended Citation GB/T 7714 | Jiang, Yu,Ma, Xunpeng,Xu, Yun,et al. Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions[J]. JOURNAL OF APPLIED PHYSICS,2014,116(17):173702. |
| APA | Jiang, Yu,Ma, Xunpeng,Xu, Yun,&Song, Guofeng.(2014).Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions.JOURNAL OF APPLIED PHYSICS,116(17),173702. |
| MLA | Jiang, Yu,et al."Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions".JOURNAL OF APPLIED PHYSICS 116.17(2014):173702. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Finite difference me（1111KB） | 限制开放 | License | Application Full Text | |||
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