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Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions
Jiang, Yu; Ma, Xunpeng; Xu, Yun; Song, Guofeng
2014
Source PublicationJOURNAL OF APPLIED PHYSICS
Volume116Issue:17Pages:173702
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2015-03-01
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/25950
Collection纳米光电子实验室
Recommended Citation
GB/T 7714
Jiang, Yu,Ma, Xunpeng,Xu, Yun,et al. Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions[J]. JOURNAL OF APPLIED PHYSICS,2014,116(17):173702.
APA Jiang, Yu,Ma, Xunpeng,Xu, Yun,&Song, Guofeng.(2014).Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions.JOURNAL OF APPLIED PHYSICS,116(17),173702.
MLA Jiang, Yu,et al."Finite difference method for analyzing band structure in semiconductor heterostructures without spurious solutions".JOURNAL OF APPLIED PHYSICS 116.17(2014):173702.
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