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Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars
Qiao, YB; Feng, SW; Zhang, GC; Xiong, C; Zhu, H; Guo, CS
2014
Source PublicationIEEE TRANSACTIONS ON ELECTRON DEVICES
Volume61Issue:8Pages:2854-2858
Subject Area半导体器件
Indexed BySCI
Language英语
Date Available2015-02-06
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/25947
Collection光电子器件国家工程中心
Recommended Citation
GB/T 7714
Qiao, YB,Feng, SW,Zhang, GC,et al. Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2014,61(8):2854-2858.
APA Qiao, YB,Feng, SW,Zhang, GC,Xiong, C,Zhu, H,&Guo, CS.(2014).Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars.IEEE TRANSACTIONS ON ELECTRON DEVICES,61(8),2854-2858.
MLA Qiao, YB,et al."Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars".IEEE TRANSACTIONS ON ELECTRON DEVICES 61.8(2014):2854-2858.
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