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应用于光电子器件光信号监测的光耦合结构
王欣; 邓晔; 刘宇; 祝宁华
Rights Holder中国科学院半导体研究所
Date Available2014-09-17
Country中国
Subtype发明
Subject Area光电子学
Application Date2014-06-19
Application NumberCN201410276361.9
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25916
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
王欣,邓晔,刘宇,等. 应用于光电子器件光信号监测的光耦合结构.
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