SEMI OpenIR  > 光电系统实验室
一种拖曳式光纤温深剖面连续测量系统
王永杰; 卢宝莉; 戴兴; 刘元辉; 李芳; 刘育梁
Rights Holder中国科学院半导体研究所
Date Available2014-04-30
Country中国
Subtype发明
Subject Area光电子学
Application Date2014-01-22
Application NumberCN201410030644.5
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25872
Collection光电系统实验室
Recommended Citation
GB/T 7714
王永杰,卢宝莉,戴兴,等. 一种拖曳式光纤温深剖面连续测量系统.
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