SEMI OpenIR  > 中科院半导体材料科学重点实验室
Structural and magnetic properties of Yb-implanted GaN
Yin Chunhai ,Liu Chao,Tao Dongyan and Zeng Yiping
2013
Source PublicationJournal of Semiconductors
Volume34Issue:5Pages:053002
Subject Area半导体材料
Indexed ByEI
Language英语
Date Available2014-05-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24999
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Yin Chunhai ,Liu Chao,Tao Dongyan and Zeng Yiping. Structural and magnetic properties of Yb-implanted GaN[J]. Journal of Semiconductors,2013,34(5):053002.
APA Yin Chunhai ,Liu Chao,Tao Dongyan and Zeng Yiping.(2013).Structural and magnetic properties of Yb-implanted GaN.Journal of Semiconductors,34(5),053002.
MLA Yin Chunhai ,Liu Chao,Tao Dongyan and Zeng Yiping."Structural and magnetic properties of Yb-implanted GaN".Journal of Semiconductors 34.5(2013):053002.
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