Product level accelerated lifetime test for indoor LED luminaires | |
Koh, Sau; Yuan, Cadmus; Sun, Bo; Li, Bob; Fan, Xuejun; Zhang, G.Q. | |
2013 | |
Source Publication | 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
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Pages | 6529995 |
Subject Area | 光电子学 |
Indexed By | EI |
Language | 英语 |
Date Available | 2014-05-16 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/24983 |
Collection | 集成光电子学国家重点实验室 |
Recommended Citation GB/T 7714 | Koh, Sau,Yuan, Cadmus,Sun, Bo,et al. Product level accelerated lifetime test for indoor LED luminaires[J]. 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,2013:6529995. |
APA | Koh, Sau,Yuan, Cadmus,Sun, Bo,Li, Bob,Fan, Xuejun,&Zhang, G.Q..(2013).Product level accelerated lifetime test for indoor LED luminaires.2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,6529995. |
MLA | Koh, Sau,et al."Product level accelerated lifetime test for indoor LED luminaires".2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013 (2013):6529995. |
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