SEMI OpenIR  > 集成光电子学国家重点实验室
Product level accelerated lifetime test for indoor LED luminaires
Koh, Sau; Yuan, Cadmus; Sun, Bo; Li, Bob; Fan, Xuejun; Zhang, G.Q.
2013
Source Publication2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
Pages6529995
Subject Area光电子学
Indexed ByEI
Language英语
Date Available2014-05-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24983
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Koh, Sau,Yuan, Cadmus,Sun, Bo,et al. Product level accelerated lifetime test for indoor LED luminaires[J]. 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,2013:6529995.
APA Koh, Sau,Yuan, Cadmus,Sun, Bo,Li, Bob,Fan, Xuejun,&Zhang, G.Q..(2013).Product level accelerated lifetime test for indoor LED luminaires.2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,6529995.
MLA Koh, Sau,et al."Product level accelerated lifetime test for indoor LED luminaires".2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013 (2013):6529995.
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