| Product level accelerated lifetime test for indoor LED luminaires | |
| Koh, Sau; Yuan, Cadmus; Sun, Bo; Li, Bob; Fan, Xuejun; Zhang, G.Q. | |
| 2013 | |
| Source Publication | 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
 |
| Pages | 6529995 |
| Subject Area | 光电子学 |
| Indexed By | EI |
| Language | 英语 |
| Date Available | 2014-05-16 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/24983 |
| Collection | 集成光电子学国家重点实验室 |
| Recommended Citation GB/T 7714 | Koh, Sau,Yuan, Cadmus,Sun, Bo,et al. Product level accelerated lifetime test for indoor LED luminaires[J]. 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,2013:6529995. |
| APA | Koh, Sau,Yuan, Cadmus,Sun, Bo,Li, Bob,Fan, Xuejun,&Zhang, G.Q..(2013).Product level accelerated lifetime test for indoor LED luminaires.2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013,6529995. |
| MLA | Koh, Sau,et al."Product level accelerated lifetime test for indoor LED luminaires".2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013 (2013):6529995. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Product level accele（959KB） | 限制开放 | License | Application Full Text | |||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment