SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
Determination of structure and polarity of SiC single crystal by X-ray diffraction technique
Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu
2001
Source PublicationChinese Journal of Semiconductors
Volume22Issue:1Pages:35-39
Subject Area光电子学
Date Available2014-05-15
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24965
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu. Determination of structure and polarity of SiC single crystal by X-ray diffraction technique[J]. Chinese Journal of Semiconductors,2001,22(1):35-39.
APA Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu.(2001).Determination of structure and polarity of SiC single crystal by X-ray diffraction technique.Chinese Journal of Semiconductors,22(1),35-39.
MLA Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu."Determination of structure and polarity of SiC single crystal by X-ray diffraction technique".Chinese Journal of Semiconductors 22.1(2001):35-39.
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