Knowledge Management System Of Institute of Semiconductors,CAS
Determination of structure and polarity of SiC single crystal by X-ray diffraction technique | |
Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu | |
2001 | |
Source Publication | Chinese Journal of Semiconductors
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Volume | 22Issue:1Pages:35-39 |
Subject Area | 光电子学 |
Date Available | 2014-05-15 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/24965 |
Collection | 中国科学院半导体研究所(2009年前) |
Recommended Citation GB/T 7714 | Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu. Determination of structure and polarity of SiC single crystal by X-ray diffraction technique[J]. Chinese Journal of Semiconductors,2001,22(1):35-39. |
APA | Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu.(2001).Determination of structure and polarity of SiC single crystal by X-ray diffraction technique.Chinese Journal of Semiconductors,22(1),35-39. |
MLA | Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu."Determination of structure and polarity of SiC single crystal by X-ray diffraction technique".Chinese Journal of Semiconductors 22.1(2001):35-39. |
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