Determination of structure and polarity of SiC single crystal by X-ray diffraction technique

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Determination of structure and polarity of SiC single crystal by X-ray diffraction technique
	Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu
	2001
Source Publication	Chinese Journal of Semiconductors
Volume	22 Issue:1 Pages:35-39
Subject Area	光电子学
Date Available	2014-05-15
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/24965
Collection	中国科学院半导体研究所（2009年前）
Recommended Citation GB/T 7714	Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu. Determination of structure and polarity of SiC single crystal by X-ray diffraction technique[J]. Chinese Journal of Semiconductors,2001,22(1):35-39.
APA	Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu.(2001).Determination of structure and polarity of SiC single crystal by X-ray diffraction technique.Chinese Journal of Semiconductors,22(1),35-39.
MLA	Zheng Xinhe, Qu Bo, Wang Yutian, Yang Hui, Liang Junwu."Determination of structure and polarity of SiC single crystal by X-ray diffraction technique".Chinese Journal of Semiconductors 22.1(2001):35-39.

Related Services

Bookmark

Google Scholar

Similar articles in Bing Scholar

Terms of Use

No data!

Social Bookmark/Share

All comments (0)

No comment.

The comment function is only available to registered usersLog In

If you have any objections to this item, please fill out the form below and the administrator will contact you as soon as possible.
Content:
Email：	*
Institution:
Verification Code:	Refresh

Any comments and suggestions are welcomed.
Title:	*
Content:
Email：	*
Verification Code:	Refresh

中国科学院半导体研究所机构知识库