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Rapid evaluation method for the normal lifetime of an infrared light-emitting diode
Xiaofeng, Guo; Manqing, Tan; Xin, Wei; Jian, Jiao; Wentao, Guo; Ningning, Sun
2013
Source PublicationJournal of Semiconductors
Volume34Issue:11Pages:114009
Subject Area光电子学
Indexed ByEI
Language英语
Date Available2014-04-28
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24804
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Xiaofeng, Guo,Manqing, Tan,Xin, Wei,et al. Rapid evaluation method for the normal lifetime of an infrared light-emitting diode[J]. Journal of Semiconductors,2013,34(11):114009.
APA Xiaofeng, Guo,Manqing, Tan,Xin, Wei,Jian, Jiao,Wentao, Guo,&Ningning, Sun.(2013).Rapid evaluation method for the normal lifetime of an infrared light-emitting diode.Journal of Semiconductors,34(11),114009.
MLA Xiaofeng, Guo,et al."Rapid evaluation method for the normal lifetime of an infrared light-emitting diode".Journal of Semiconductors 34.11(2013):114009.
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