| Rapid evaluation method for the normal lifetime of an infrared light-emitting diode | |
| Xiaofeng, Guo; Manqing, Tan; Xin, Wei; Jian, Jiao; Wentao, Guo; Ningning, Sun | |
| 2013 | |
| Source Publication | Journal of Semiconductors
 |
| Volume | 34Issue:11Pages:114009 |
| Subject Area | 光电子学 |
| Indexed By | EI |
| Language | 英语 |
| Date Available | 2014-04-28 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/24804 |
| Collection | 光电子研究发展中心 |
| Recommended Citation GB/T 7714 | Xiaofeng, Guo,Manqing, Tan,Xin, Wei,et al. Rapid evaluation method for the normal lifetime of an infrared light-emitting diode[J]. Journal of Semiconductors,2013,34(11):114009. |
| APA | Xiaofeng, Guo,Manqing, Tan,Xin, Wei,Jian, Jiao,Wentao, Guo,&Ningning, Sun.(2013).Rapid evaluation method for the normal lifetime of an infrared light-emitting diode.Journal of Semiconductors,34(11),114009. |
| MLA | Xiaofeng, Guo,et al."Rapid evaluation method for the normal lifetime of an infrared light-emitting diode".Journal of Semiconductors 34.11(2013):114009. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Rapid evaluation met（269KB） | 限制开放 | License | Application Full Text | |||
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