Rapid evaluation method for the normal lifetime of an infrared light-emitting diode | |
Xiaofeng, Guo; Manqing, Tan; Xin, Wei; Jian, Jiao; Wentao, Guo; Ningning, Sun | |
2013 | |
Source Publication | Journal of Semiconductors
![]() |
Volume | 34Issue:11Pages:114009 |
Subject Area | 光电子学 |
Indexed By | EI |
Language | 英语 |
Date Available | 2014-04-28 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/24804 |
Collection | 光电子研究发展中心 |
Recommended Citation GB/T 7714 | Xiaofeng, Guo,Manqing, Tan,Xin, Wei,et al. Rapid evaluation method for the normal lifetime of an infrared light-emitting diode[J]. Journal of Semiconductors,2013,34(11):114009. |
APA | Xiaofeng, Guo,Manqing, Tan,Xin, Wei,Jian, Jiao,Wentao, Guo,&Ningning, Sun.(2013).Rapid evaluation method for the normal lifetime of an infrared light-emitting diode.Journal of Semiconductors,34(11),114009. |
MLA | Xiaofeng, Guo,et al."Rapid evaluation method for the normal lifetime of an infrared light-emitting diode".Journal of Semiconductors 34.11(2013):114009. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Rapid evaluation met(269KB) | 限制开放 | License | Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment