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The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers | |
Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng | |
2013 | |
Source Publication | Acta Physica Sinica
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Volume | 62Issue:11Pages:110702 |
Subject Area | 半导体物理 |
Indexed By | SCI |
Language | 英语 |
Date Available | 2014-03-26 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/24586 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng. The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers[J]. Acta Physica Sinica,2013,62(11):110702. |
APA | Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng.(2013).The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers.Acta Physica Sinica,62(11),110702. |
MLA | Han Wen-Peng, Shi Yan-Meng, Li Xiao-Li, Luo Shi-Qiang, Lu Yan, Tan Ping-Heng."The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals: A case of graphene multilayers".Acta Physica Sinica 62.11(2013):110702. |
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The numerical-apertu(2482KB) | 限制开放 | License | Application Full Text |
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