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Low-Temperature Performance of Accumulation-Mode p-Channel Wrap-Gated FinFETs
Zhang, Yanbo; Du, Yandong; Chen, Yankun; Li, Xiaoming; Yang, Xiang; Han, Weihua; Yang, Fuhua
2013
Source PublicationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume13Issue:2Pages:804-807
Subject Area微电子学
Indexed BySCI
Language英语
Date Available2013-10-08
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24405
Collection半导体集成技术工程研究中心
Recommended Citation
GB/T 7714
Zhang, Yanbo,Du, Yandong,Chen, Yankun,et al. Low-Temperature Performance of Accumulation-Mode p-Channel Wrap-Gated FinFETs[J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,2013,13(2):804-807.
APA Zhang, Yanbo.,Du, Yandong.,Chen, Yankun.,Li, Xiaoming.,Yang, Xiang.,...&Yang, Fuhua.(2013).Low-Temperature Performance of Accumulation-Mode p-Channel Wrap-Gated FinFETs.JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,13(2),804-807.
MLA Zhang, Yanbo,et al."Low-Temperature Performance of Accumulation-Mode p-Channel Wrap-Gated FinFETs".JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY 13.2(2013):804-807.
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