SEMI OpenIR  > 中科院半导体材料科学重点实验室
X-ray probe of GaN thin films grown on InGaN compliant substrates
Xu, Xiaoqing; Li, Yang; Liu, Jianming; Wei, Hongyuan; Liu, Xianglin; Yang, Shaoyan; Wang, Zhanguo; Wang, Huanhua
2013
Source PublicationAPPLIED PHYSICS LETTERS
Volume102Issue:13Pages:132104
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2013-08-27
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24306
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Xu, Xiaoqing,Li, Yang,Liu, Jianming,et al. X-ray probe of GaN thin films grown on InGaN compliant substrates[J]. APPLIED PHYSICS LETTERS,2013,102(13):132104.
APA Xu, Xiaoqing.,Li, Yang.,Liu, Jianming.,Wei, Hongyuan.,Liu, Xianglin.,...&Wang, Huanhua.(2013).X-ray probe of GaN thin films grown on InGaN compliant substrates.APPLIED PHYSICS LETTERS,102(13),132104.
MLA Xu, Xiaoqing,et al."X-ray probe of GaN thin films grown on InGaN compliant substrates".APPLIED PHYSICS LETTERS 102.13(2013):132104.
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