SEMI OpenIR  > 半导体超晶格国家重点实验室
Anomalous Raman spectra and thickness-dependent electronic properties of WSe2
Sahin, H.; Tongay, S.; Horzum, S.; Fan, W.; Zhou, J.; Li, J.; Wu, J.; Peeters, F. M.
2013
Source PublicationPHYSICAL REVIEW B
Volume87Issue:16Pages:165409
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2013-08-27
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24292
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Sahin, H.,Tongay, S.,Horzum, S.,et al. Anomalous Raman spectra and thickness-dependent electronic properties of WSe2[J]. PHYSICAL REVIEW B,2013,87(16):165409.
APA Sahin, H..,Tongay, S..,Horzum, S..,Fan, W..,Zhou, J..,...&Peeters, F. M..(2013).Anomalous Raman spectra and thickness-dependent electronic properties of WSe2.PHYSICAL REVIEW B,87(16),165409.
MLA Sahin, H.,et al."Anomalous Raman spectra and thickness-dependent electronic properties of WSe2".PHYSICAL REVIEW B 87.16(2013):165409.
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