SEMI OpenIR  > 光电子器件国家工程中心
980nm半导体激光器长期老化结果及失效分析
刘斌,刘媛媛,崔碧峰
2012
Source Publication激光与光电子学进展
Volume49Issue:9Pages:091404-1-091404-5
Subject Area半导体器件
Indexed ByCSCD
Language英语
Date Available2013-05-29
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24094
Collection光电子器件国家工程中心
Recommended Citation
GB/T 7714
刘斌,刘媛媛,崔碧峰. 980nm半导体激光器长期老化结果及失效分析[J]. 激光与光电子学进展,2012,49(9):091404-1-091404-5.
APA 刘斌,刘媛媛,崔碧峰.(2012).980nm半导体激光器长期老化结果及失效分析.激光与光电子学进展,49(9),091404-1-091404-5.
MLA 刘斌,刘媛媛,崔碧峰."980nm半导体激光器长期老化结果及失效分析".激光与光电子学进展 49.9(2012):091404-1-091404-5.
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