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A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices
Wu XM (Wu, Xuming); Man JW (Man, Jiangwei); Xie L (Xie, Liang); Liu JG (Liu, Jianguo); Liu Y (Liu, Yu); Zhu NH (Zhu, Ninghua)
2012
Source PublicationIEEE PHOTONICS JOURNAL
Volume4Issue:5Pages:1679-1685
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2013-03-27
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23819
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Wu XM ,Man JW ,Xie L ,et al. A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices[J]. IEEE PHOTONICS JOURNAL,2012,4(5):1679-1685.
APA Wu XM ,Man JW ,Xie L ,Liu JG ,Liu Y ,&Zhu NH .(2012).A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices.IEEE PHOTONICS JOURNAL,4(5),1679-1685.
MLA Wu XM ,et al."A New Method for Measuring the Frequency Response of Broadband Optoelectronic Devices".IEEE PHOTONICS JOURNAL 4.5(2012):1679-1685.
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