SEMI OpenIR  > 集成光电子学国家重点实验室
Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?
Zheng CC (Zheng, C. C.); Xu SJ (Xu, S. J.); Zhang F (Zhang, F.); Ning JQ (Ning, J. Q.); Zhao DG (Zhao, D. G.); Yang H (Yang, H.); Che CM (Che, C. M.)
2012
Source PublicationAPPLIED PHYSICS LETTERS
Volume101Issue:19Pages:191102
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2013-03-27
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23803
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Zheng CC ,Xu SJ ,Zhang F ,et al. Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?[J]. APPLIED PHYSICS LETTERS,2012,101(19):191102.
APA Zheng CC .,Xu SJ .,Zhang F .,Ning JQ .,Zhao DG .,...&Che CM .(2012).Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?.APPLIED PHYSICS LETTERS,101(19),191102.
MLA Zheng CC ,et al."Can interference patterns in the reflectance spectra of GaN epilayers give important information of carrier concentration?".APPLIED PHYSICS LETTERS 101.19(2012):191102.
Files in This Item:
File Name/Size DocType Version Access License
2012038.pdf(633KB) 限制开放LicenseApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zheng CC (Zheng, C. C.)]'s Articles
[Xu SJ (Xu, S. J.)]'s Articles
[Zhang F (Zhang, F.)]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zheng CC (Zheng, C. C.)]'s Articles
[Xu SJ (Xu, S. J.)]'s Articles
[Zhang F (Zhang, F.)]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zheng CC (Zheng, C. C.)]'s Articles
[Xu SJ (Xu, S. J.)]'s Articles
[Zhang F (Zhang, F.)]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.