SEMI OpenIR  > 半导体超晶格国家重点实验室
A scanning tunneling microscope capable of imaging specified micron-scale small samples
Tao W (Tao, Wei); Cao YF (Cao, Yufei); Wang HF (Wang, Huafeng); Wang KY (Wang, Kaiyou); Lu QY (Lu, Qingyou)
2012
Source PublicationREVIEW OF SCIENTIFIC INSTRUMENTS
Volume83Issue:12Pages:123701
Subject Area半导体物理
Date Available2013-03-27
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23800
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Tao W ,Cao YF ,Wang HF ,et al. A scanning tunneling microscope capable of imaging specified micron-scale small samples[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2012,83(12):123701.
APA Tao W ,Cao YF ,Wang HF ,Wang KY ,&Lu QY .(2012).A scanning tunneling microscope capable of imaging specified micron-scale small samples.REVIEW OF SCIENTIFIC INSTRUMENTS,83(12),123701.
MLA Tao W ,et al."A scanning tunneling microscope capable of imaging specified micron-scale small samples".REVIEW OF SCIENTIFIC INSTRUMENTS 83.12(2012):123701.
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