SEMI OpenIR  > 高速电路与神经网络实验室
Research on the Parameter Drift Problem of Near Infrared Spectra Based Corn Variety Discrimination Technology
Zhang LP (Zhang Li-ping); Li WJ (Li Wei-jun); Wang P (Wang Ping); An D (An Dong)
2012
Source PublicationSPECTROSCOPY AND SPECTRAL ANALYSIS
Volume32Issue:10Pages:2785-2788
Subject Area人工智能
Indexed BySCI
Language英语
Date Available2013-03-26
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23793
Collection高速电路与神经网络实验室
Recommended Citation
GB/T 7714
Zhang LP ,Li WJ ,Wang P ,et al. Research on the Parameter Drift Problem of Near Infrared Spectra Based Corn Variety Discrimination Technology[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS,2012,32(10):2785-2788.
APA Zhang LP ,Li WJ ,Wang P ,&An D .(2012).Research on the Parameter Drift Problem of Near Infrared Spectra Based Corn Variety Discrimination Technology.SPECTROSCOPY AND SPECTRAL ANALYSIS,32(10),2785-2788.
MLA Zhang LP ,et al."Research on the Parameter Drift Problem of Near Infrared Spectra Based Corn Variety Discrimination Technology".SPECTROSCOPY AND SPECTRAL ANALYSIS 32.10(2012):2785-2788.
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