SEMI OpenIR  > 中科院半导体材料科学重点实验室
Calculation of discrepancies in measured valence band offsets of heterojunctions with different crystal polarities
Li HJ (Li, Huijie); Liu XL (Liu, Xianglin); Wang JX (Wang, Jianxia); Jin DD (Jin, Dongdong); Zhang H (Zhang, Heng); Yang SY (Yang, Shaoyan); Liu SM (Liu, Shuman); Mao W (Mao, Wei); Hao Y (Hao, Yue); Zhu QS (Zhu, QinSheng); Wang ZG (Wang, Zhanguo)
2012
Source PublicationJOURNAL OF APPLIED PHYSICS
Volume112Issue:11Pages:113712
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2013-03-26
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23765
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Li HJ ,Liu XL ,Wang JX ,et al. Calculation of discrepancies in measured valence band offsets of heterojunctions with different crystal polarities[J]. JOURNAL OF APPLIED PHYSICS,2012,112(11):113712.
APA Li HJ .,Liu XL .,Wang JX .,Jin DD .,Zhang H .,...&Wang ZG .(2012).Calculation of discrepancies in measured valence band offsets of heterojunctions with different crystal polarities.JOURNAL OF APPLIED PHYSICS,112(11),113712.
MLA Li HJ ,et al."Calculation of discrepancies in measured valence band offsets of heterojunctions with different crystal polarities".JOURNAL OF APPLIED PHYSICS 112.11(2012):113712.
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