SEMI OpenIR  > 中科院半导体材料科学重点实验室
A normal incident quantum cascade detector enhanced by surface plasmons
Zhai, SQ; Liu, JQ; Liu, FQ; Wang, ZG
2012
Source PublicationAPPLIED PHYSICS LETTERS
Volume100Issue:18Pages:181104
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2013-03-17
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23669
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Zhai, SQ,Liu, JQ,Liu, FQ,et al. A normal incident quantum cascade detector enhanced by surface plasmons[J]. APPLIED PHYSICS LETTERS,2012,100(18):181104.
APA Zhai, SQ,Liu, JQ,Liu, FQ,&Wang, ZG.(2012).A normal incident quantum cascade detector enhanced by surface plasmons.APPLIED PHYSICS LETTERS,100(18),181104.
MLA Zhai, SQ,et al."A normal incident quantum cascade detector enhanced by surface plasmons".APPLIED PHYSICS LETTERS 100.18(2012):181104.
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