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Novel Method for Frequency Response Measurement of Optoelectronic Devices
Wu, XM; Man, JW; Xie, L; Liu, Y; Qi, XQ; Wang, LX; Liu, JG; Zhu, NH
2012
Source PublicationIEEE PHOTONICS TECHNOLOGY LETTERS
Volume24Issue:7Pages:575-577
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2013-03-17
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23668
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Wu, XM,Man, JW,Xie, L,et al. Novel Method for Frequency Response Measurement of Optoelectronic Devices[J]. IEEE PHOTONICS TECHNOLOGY LETTERS,2012,24(7):575-577.
APA Wu, XM.,Man, JW.,Xie, L.,Liu, Y.,Qi, XQ.,...&Zhu, NH.(2012).Novel Method for Frequency Response Measurement of Optoelectronic Devices.IEEE PHOTONICS TECHNOLOGY LETTERS,24(7),575-577.
MLA Wu, XM,et al."Novel Method for Frequency Response Measurement of Optoelectronic Devices".IEEE PHOTONICS TECHNOLOGY LETTERS 24.7(2012):575-577.
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