Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunction | |
Liu, B; Lu, YW; Huang, Y; Liu, GP; Zhu, QS; Wang, ZG | |
2012 | |
Source Publication | PHYSICS LETTERS A
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Volume | 376Issue:2012-10-11Pages:1067-1071 |
Subject Area | 光电子学 |
Indexed By | SCI |
Language | 英语 |
Date Available | 2013-03-17 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/23607 |
Collection | 半导体集成技术工程研究中心 |
Recommended Citation GB/T 7714 | Liu, B,Lu, YW,Huang, Y,et al. Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunction[J]. PHYSICS LETTERS A,2012,376(2012-10-11):1067-1071. |
APA | Liu, B,Lu, YW,Huang, Y,Liu, GP,Zhu, QS,&Wang, ZG.(2012).Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunction.PHYSICS LETTERS A,376(2012-10-11),1067-1071. |
MLA | Liu, B,et al."Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunction".PHYSICS LETTERS A 376.2012-10-11(2012):1067-1071. |
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