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荧光寿命成像技术及其研究进展
刘超; 周燕; 王新伟; 刘育梁
2011
Source Publication激光与光电子学进展
Volume48Issue:11Pages:111102-1-111102-6
Abstract荧光寿命显微成像(FLIM)技术是一种新颖的荧光成像技术,具有其他荧光成像方法无法替代的优异性能,是生物医学工程领域的研究热点。频域调制、门控探测和时间相关单光子计数(TCSPC)是FLIM的几种主要实现方法。综述了这些技术的原理、研究现状和已取得的部分成果,比较了这三种方法的时间分辨率和成像速度等参数的优劣。宽场FLIM更适用于延时成像和实时成像。荧光偏振各相异性成像和内窥镜FLIM技术都是FLIM技术很有前景的应用方向。
metadata_83光电系统实验室
Subject Area光电子学
Funding Organization基金
Indexed ByCSCD
Language中文
CSCD IDCSCD:4361594
Date Available2012-07-17
Citation statistics
Cited Times:5[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23262
Collection光电系统实验室
Recommended Citation
GB/T 7714
刘超,周燕,王新伟,等. 荧光寿命成像技术及其研究进展[J]. 激光与光电子学进展,2011,48(11):111102-1-111102-6.
APA 刘超,周燕,王新伟,&刘育梁.(2011).荧光寿命成像技术及其研究进展.激光与光电子学进展,48(11),111102-1-111102-6.
MLA 刘超,et al."荧光寿命成像技术及其研究进展".激光与光电子学进展 48.11(2011):111102-1-111102-6.
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