SEMI OpenIR  > 中科院半导体材料科学重点实验室
Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF
Qiu, Jifang; Yin, Zuoshan; Sun, Kai; Chen, Lawrence R.; Rochette, Martin; Wu, Jian; Zhao, Lingjuan; Wang, Wei; Qiu, J.(jifangqiu@semi.ac.cn)
2011
Source Publication16th Opto-Electronics and Communications Conference, OECC2011
Pages573-574
AbstractWe investigate the wavelength-dependent performance of an all-optical multi-logic gate based on XPM. Simulation results show that this scheme is applicable over the whole C-band when the wavelength separation is between4nm and33nm?2011 National Sun Yat-Sen Univ.
metadata_83中科院半导体材料科学重点实验室
Subject Area半导体材料
Indexed ByEI
Date Available2012-06-14
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/23137
Collection中科院半导体材料科学重点实验室
Corresponding AuthorQiu, J.(jifangqiu@semi.ac.cn)
Recommended Citation
GB/T 7714
Qiu, Jifang,Yin, Zuoshan,Sun, Kai,et al. Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF[J]. 16th Opto-Electronics and Communications Conference, OECC2011,2011:573-574.
APA Qiu, Jifang.,Yin, Zuoshan.,Sun, Kai.,Chen, Lawrence R..,Rochette, Martin.,...&Qiu, J..(2011).Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF.16th Opto-Electronics and Communications Conference, OECC2011,573-574.
MLA Qiu, Jifang,et al."Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF".16th Opto-Electronics and Communications Conference, OECC2011 (2011):573-574.
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