| A radiation-hardened SOI-based FPGA | |
| Han, Xiaowei; Wu, Lihua; Zhao, Yan; Li, Yan; Zhang, Qianli; Chen, Liang; Zhang, Guoquan; Li, Jianzhong; Yang, Bo; Gao, Jiantou; Wang, Jian; Li, Ming; Liu, Guizhai; Zhang, Feng; Guo, Xufeng; Stanley, L. Chen; Liu, Zhongli; Yu, Fang; Zhao, Kai; Han, X.(xiaowei@semi.ac.cn) | |
| 2011 | |
| Source Publication | Journal of Semiconductors
 |
| ISSN | 16744926 |
| Volume | 32Issue:7Pages:75012 |
| Abstract | A radiation-hardened SRAM-based field programmable gate array VS1000 is designed and fabricated with a0.5μm partial-depletion silicon-on-insulator logic process at the CETC58th Institute. The new logic cell(LC), with a multi-mode based on3-input look-up-table(LUT), increases logic density about12% compared to a traditional4-input LUT The logic block(LB), consisting of2 LCs, can be used in two functional modes: LUT mode and distributed read access memory mode. The hierarchical routing channel block and switch block can significantly improve the flexibility and routability of the routing resource. The VS1000 uses a CQFP208 package and contains392 reconfigurable LCs,112 reconfigurable user I/Os and IEEE1149.1 compatible with boundary-scan logic for testing and programming. The function test results indicate that the hardware and software cooperate successfully and the VS1000 works correctly. Moreover, the radiation test results indicate that the VS1000 chip has total dose tolerance of100 krad(Si), a dose rate survivability of1.5×1011 rad(Si)/s and a neutron fluence immunity of1×1014 n/cm2.?2011 Chinese Institute of Electronics. |
| metadata_83 | 半导体集成技术工程研究中心 |
| Keyword | Field Programmable Gate Arrays(Fpga) Logic Devices Software Testing Static Random Access Storage |
| Subject Area | 微电子学 |
| Indexed By | EI |
| Language | 英语 |
| Date Available | 2012-06-14 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/23069 |
| Collection | 半导体集成技术工程研究中心 |
| Corresponding Author | Han, X.(xiaowei@semi.ac.cn) |
| Recommended Citation GB/T 7714 | Han, Xiaowei,Wu, Lihua,Zhao, Yan,et al. A radiation-hardened SOI-based FPGA[J]. Journal of Semiconductors,2011,32(7):75012. |
| APA | Han, Xiaowei.,Wu, Lihua.,Zhao, Yan.,Li, Yan.,Zhang, Qianli.,...&Han, X..(2011).A radiation-hardened SOI-based FPGA.Journal of Semiconductors,32(7),75012. |
| MLA | Han, Xiaowei,et al."A radiation-hardened SOI-based FPGA".Journal of Semiconductors 32.7(2011):75012. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 2012143.pdf（283KB） | 限制开放 | License | Application Full Text | |||
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