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Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators
Yao, Qi-Feng; Lin, Jian-Dong; Yang, Yue-De; Huang, Yong-Zhen; Yao, Q.-F.
2011
Source PublicationProceedings of SPIE- The International Society for Optical Engineering
ISSN0277786X
Volume8308Pages:83080N
AbstractWavelength-scale defected circular microresonators with laterally confined metal layer are designed for directional emission from high Q confined modes by boundary element method(BEM), which is firstly applied to the multilayer structures. The influence of metal layer thickness on the mode filed patterns and Q factors are simulated. The results indicate that the thickness of the metal layer has a great effect on far-field emission patterns and the mode Q factors.?2011 SPIE-OSA-IEEE.
metadata_83集成光电子学国家重点实验室
KeywordMetals Optical Resonators Optoelectronic Devices q Factor Measurement
Subject Area光电子学
Indexed ByEI
Language英语
Date Available2012-06-13
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/22970
Collection集成光电子学国家重点实验室
Corresponding AuthorYao, Q.-F.
Recommended Citation
GB/T 7714
Yao, Qi-Feng,Lin, Jian-Dong,Yang, Yue-De,et al. Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators[J]. Proceedings of SPIE- The International Society for Optical Engineering,2011,8308:83080N.
APA Yao, Qi-Feng,Lin, Jian-Dong,Yang, Yue-De,Huang, Yong-Zhen,&Yao, Q.-F..(2011).Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators.Proceedings of SPIE- The International Society for Optical Engineering,8308,83080N.
MLA Yao, Qi-Feng,et al."Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators".Proceedings of SPIE- The International Society for Optical Engineering 8308(2011):83080N.
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