| Microwave Study of FeSe(0.3)Te(0.7) Thin Film by TE(011)-Mode Sapphire Dielectric Resonator | |
| Wu, Y; Zhou, SY; Wang, XY; Cao, LX; Zhang, XQ; Luo, S; He, YS; Barannik, AA; Cherpak, NT; Skresanov, VN; Wu, Y (reprint author), Univ Sci & Technol Beijing, Dept Phys, Beijing 100083, Peoples R China,sluo@sas.ustb.edu.cn | |
| 2011 | |
| Source Publication | IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
 |
| ISSN | 1051-8223 |
| Volume | 21Issue:3Pages:599-601 |
| Abstract | High quality epitaxial thin films of FeSe(1-x)Te(x) (x = 0-1) have been successfully fabricated. Their superconducting transition temperatures are around 8-13 K. Microwave properties of a film (x = 0.7) was studied by a sapphire dielectric cavity at 9.315 GHz. The cavity, which has a quality factor of 45000 in room temperature with TE(011)-mode, is specially designed for the measurement of small samples with the sapphire cylinder having a small hole in the center. Thin film samples with dimension of 1-2 mm can be put in the middle of the hole, supported by a very thin sapphire rod. The cavity is sealed in a vacuum chamber soaked in the liquid (4)He and the temperature of the thin sapphire rod (hence the sample) can be controlled from 1.6 K to 60 K with a stability about +/-1 mK. Temperature dependence of transmission response and Q-factors were measured by a network analyser (Agilent N5230C). The results showed a clear signature of multi-gap superconductivity. No evidences of existence of node in the energy gap were found as the normalized change in the surface reactance and the corresponding normalized change in the in-plane penetration depth have flat dependence at low temperatures. |
| metadata_83 | 中科院半导体材料科学重点实验室 |
| Keyword | Cavity Resonator Microwave Measurement Multi-gap Node |
| Subject Area | 半导体材料 |
| Funding Organization | University of Science and Technology Beijing[10974014]; Institute of Physics, Chinese Academy of Science[GJHZ1007]; Chinese Academy of Sciences[KJCX2-YW-W16] |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2012-02-06 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/22787 |
| Collection | 中科院半导体材料科学重点实验室 |
| Corresponding Author | Wu, Y (reprint author), Univ Sci & Technol Beijing, Dept Phys, Beijing 100083, Peoples R China,sluo@sas.ustb.edu.cn |
| Recommended Citation GB/T 7714 | Wu, Y,Zhou, SY,Wang, XY,et al. Microwave Study of FeSe(0.3)Te(0.7) Thin Film by TE(011)-Mode Sapphire Dielectric Resonator[J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,2011,21(3):599-601. |
| APA | Wu, Y.,Zhou, SY.,Wang, XY.,Cao, LX.,Zhang, XQ.,...&Wu, Y .(2011).Microwave Study of FeSe(0.3)Te(0.7) Thin Film by TE(011)-Mode Sapphire Dielectric Resonator.IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,21(3),599-601. |
| MLA | Wu, Y,et al."Microwave Study of FeSe(0.3)Te(0.7) Thin Film by TE(011)-Mode Sapphire Dielectric Resonator".IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY 21.3(2011):599-601. |
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| Microwave Study of F（335KB） | 限制开放 | -- | Application Full Text | |||
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