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Measurement of wurtzite ZnO/rutile TiO(2) heterojunction band offsets by x-ray photoelectron spectroscopy
Wang, J; Liu, XL; Yang, AL; Zheng, GL; Yang, SY; Wei, HY; Zhu, QS; Wang, ZG; Liu, XL (reprint author), Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China,xlliu@semi.ac.cn; why@semi.ac.cn
2011
Source PublicationAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN0947-8396
Volume103Issue:4Pages:1099-1103
AbstractThe valence-band offset of the wurtzite ZnO/rutile TiO(2) heterojunction was directly determined by x-ray photoelectron spectroscopy. The wurtzite ZnO (0001) layer was grown on commercial rutile (101) TiO(2) by metal-organic chemical-vapor deposition. The results show that the valence-band offset is 0.14 +/- 0.05 eV, which agrees well with previous results by other methods. Therefore, the conduction-band offset is deduced from their known band-gap energy values to be 0.45 +/- 0.05 eV, which indicates a type-II band alignment for the ZnO/TiO(2) heterojunction.
metadata_83中科院半导体材料科学重点实验室
KeywordSensitized Solar-cells Photocatalyzed Transformation Chloroaromatic Derivatives Zinc-oxide Films Powder Phenol
Subject Area半导体材料
Funding OrganizationNational Science Foundation of China[60776015]; Special Funds for Major State Basic Research Project (973 program) of China[2006CB604907]; 863 High Technology R&D Program of China[2007AA03Z402, 2007AA03Z451]
Indexed BySCI
Language英语
Date Available2012-02-06
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/22785
Collection中科院半导体材料科学重点实验室
Corresponding AuthorLiu, XL (reprint author), Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China,xlliu@semi.ac.cn; why@semi.ac.cn
Recommended Citation
GB/T 7714
Wang, J,Liu, XL,Yang, AL,et al. Measurement of wurtzite ZnO/rutile TiO(2) heterojunction band offsets by x-ray photoelectron spectroscopy[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,2011,103(4):1099-1103.
APA Wang, J.,Liu, XL.,Yang, AL.,Zheng, GL.,Yang, SY.,...&why@semi.ac.cn.(2011).Measurement of wurtzite ZnO/rutile TiO(2) heterojunction band offsets by x-ray photoelectron spectroscopy.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,103(4),1099-1103.
MLA Wang, J,et al."Measurement of wurtzite ZnO/rutile TiO(2) heterojunction band offsets by x-ray photoelectron spectroscopy".APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 103.4(2011):1099-1103.
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