SEMI OpenIR  > 高性能集成电路实验室
STBC-VBLAST的QRD-M检测
鉴海防; 胡东伟; 肖宛昂; 石寅
2010
Source Publication电子科技大学学报
Volume39Issue:6Pages:940-943
Contribution Rank江苏省科技成果转化专项资金
metadata_83高性能集成电路实验室
Subject Area微电子学
Indexed ByCSCD
CSCD IDCSCD:4057873
Date Available2011-08-04
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/21500
Collection高性能集成电路实验室
Recommended Citation
GB/T 7714
鉴海防,胡东伟,肖宛昂,等. STBC-VBLAST的QRD-M检测[J]. 电子科技大学学报,2010,39(6):940-943.
APA 鉴海防,胡东伟,肖宛昂,&石寅.(2010).STBC-VBLAST的QRD-M检测.电子科技大学学报,39(6),940-943.
MLA 鉴海防,et al."STBC-VBLAST的QRD-M检测".电子科技大学学报 39.6(2010):940-943.
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