SEMI OpenIR  > 中科院半导体材料科学重点实验室
Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy
Shi K; Li DB; Song HP; Guo Y; Wang J; Xu XQ; Liu JM; Yang AL; Wei HY; Zhang B; Yang SY; Liu XL; Zhu QS; Wang ZG; Shi, K, Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China. shikai@semi.ac.cn; lidb@ciomp.ac.cn; xlliu@semi.ac.cn
2011
Source PublicationNANOSCALE RESEARCH LETTERS
ISSN1931-7573
Volume6Pages:Article no.50
metadata_83[shi, k.; song, h. p.; guo, y.; wang, j.; xu, x. q.; liu, j. m.; yang, a. l.; wei, h. y.; zhang, b.; yang, s. y.; liu, x. l.; zhu, q. s.; wang, z. g.] chinese acad sci, inst semicond, key lab semicond mat sci, beijing 100083, peoples r china; [li, d. b.] chinese acad sci, changchun inst opt fine mech & phys, key lab excited state proc, changchun 130033, peoples r china
KeywordChemical-vapor-deposition Core-level Photoemission Sb-doped Sno2 Inn Growth Gan Naxwo3 Alloys Green State
Subject Area半导体材料
Funding Organization863 High Technology R&D Program of China [2007AA03Z402, 2007AA03Z451]; Special Funds for Major State Basic Research Project (973 program) of China [2006CB604907]; National Science Foundation of China [60506002, 60776015]
Indexed BySCI
Language英语
Date Available2011-07-05
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/21263
Collection中科院半导体材料科学重点实验室
Corresponding AuthorShi, K, Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China. shikai@semi.ac.cn; lidb@ciomp.ac.cn; xlliu@semi.ac.cn
Recommended Citation
GB/T 7714
Shi K,Li DB,Song HP,et al. Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy[J]. NANOSCALE RESEARCH LETTERS,2011,6:Article no.50.
APA Shi K.,Li DB.,Song HP.,Guo Y.,Wang J.,...&xlliu@semi.ac.cn.(2011).Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy.NANOSCALE RESEARCH LETTERS,6,Article no.50.
MLA Shi K,et al."Determination of InN/Diamond Heterojunction Band Offset by X-ray Photoelectron Spectroscopy".NANOSCALE RESEARCH LETTERS 6(2011):Article no.50.
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