SEMI OpenIR  > 中科院半导体材料科学重点实验室
Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy
Wang J; Liu XL; Yang AL; Zheng GL; Yang SY; Wei HY; Zhu QS; Wang ZG; Liu, XL, Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. xlliu@semi.ac.cn; why@semi.ac.cn
2011
Source PublicationAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN0947-8396
Volume103Issue:4Pages:1099-1103
metadata_83[wang, jun; liu, xiang-lin; yang, an-li; zheng, gao-lin; yang, shao-yan; wei, hong-yuan; zhu, qin-sheng; wang, zhan-guo] chinese acad sci, key lab semicond mat sci, inst semicond, beijing 100083, peoples r china
KeywordSensitized Solar-cells Photocatalyzed Transformation Chloroaromatic Derivatives Zinc-oxide Films Powder Phenol
Subject Area半导体材料
Funding OrganizationNational Science Foundation of China [60776015]; Special Funds for Major State Basic Research Project (973 program) of China [2006CB604907]; 863 High Technology R&D Program of China [2007AA03Z402, 2007AA03Z451]
Indexed BySCI
Language英语
Date Available2011-07-05
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/21229
Collection中科院半导体材料科学重点实验室
Corresponding AuthorLiu, XL, Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. xlliu@semi.ac.cn; why@semi.ac.cn
Recommended Citation
GB/T 7714
Wang J,Liu XL,Yang AL,et al. Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,2011,103(4):1099-1103.
APA Wang J.,Liu XL.,Yang AL.,Zheng GL.,Yang SY.,...&why@semi.ac.cn.(2011).Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,103(4),1099-1103.
MLA Wang J,et al."Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy".APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 103.4(2011):1099-1103.
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