| Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy | |
Shi K ; Liu XL; Li DB; Wang J; Song HP; Xu XQ; Wei HY; Jiao CM; Yang SY; Song H; Zhu QS; Wang ZG; Shi, K, 35 Tsinghua E Rd, Beijing 100083, Peoples R China. shikai@semi.ac.cn; xlliu@semi.ac.cn; lidb@ciomp.ac.cn
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| 2011 | |
| Source Publication | APPLIED SURFACE SCIENCE
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| ISSN | 0169-4332 |
| Volume | 257Issue:18Pages:8110-8112 |
| metadata_83 | [shi, k.; liu, x. l.; wang, j.; song, h. p.; xu, x. q.; wei, h. y.; jiao, c. m.; yang, s. y.; zhu, q. s.; wang, z. g.] chinese acad sci, inst semicond, key lab semicond mat sci, beijing 100083, peoples r china; [li, d. b.; song, h.] chinese acad sci, changchun inst opt fine mech & phys, key lab excited state proc, changchun 130033, peoples r china |
| Keyword | Valence Band Offset Gan/diamond Heterojunction Xps Conduction Band Offset Chemical-vapor-deposition Algan/gan Hemts Diamond Gan Films |
| Subject Area | 半导体材料 |
| Funding Organization | 863 High Technology R&D Program of China [2007AA03Z402, 2007AA03Z451]; Special Funds for Major State Basic Research Project (973 program) of China [2006CB604907]; National Science Foundation of China [60506002, 60776015] |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2011-07-05 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/21227 |
| Collection | 中科院半导体材料科学重点实验室 |
| Corresponding Author | Shi, K, 35 Tsinghua E Rd, Beijing 100083, Peoples R China. shikai@semi.ac.cn; xlliu@semi.ac.cn; lidb@ciomp.ac.cn |
| Recommended Citation GB/T 7714 | Shi K,Liu XL,Li DB,et al. Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy[J]. APPLIED SURFACE SCIENCE,2011,257(18):8110-8112. |
| APA | Shi K.,Liu XL.,Li DB.,Wang J.,Song HP.,...&lidb@ciomp.ac.cn.(2011).Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy.APPLIED SURFACE SCIENCE,257(18),8110-8112. |
| MLA | Shi K,et al."Valence band offset of GaN/diamond heterojunction measured by X-ray photoelectron spectroscopy".APPLIED SURFACE SCIENCE 257.18(2011):8110-8112. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 201108.pdf（376KB） | 限制开放 | -- | Application Full Text | |||
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