SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
扫描深能级瞬态谱技术(SDLTS)
李成基; 邓兆扬; 李韫言
1990
Source Publication电子显微学报
Volume9Issue:3Pages:154
metadata_83中科院半导体所
Subject Area半导体化学
Indexed ByCSCD
Language中文
CSCD IDCSCD:116039
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/20379
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
李成基,邓兆扬,李韫言. 扫描深能级瞬态谱技术(SDLTS)[J]. 电子显微学报,1990,9(3):154.
APA 李成基,邓兆扬,&李韫言.(1990).扫描深能级瞬态谱技术(SDLTS).电子显微学报,9(3),154.
MLA 李成基,et al."扫描深能级瞬态谱技术(SDLTS)".电子显微学报 9.3(1990):154.
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