SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
Si晶格常数超高精度传递测量中的标准晶体及制备
高维滨
1991
Source Publication半导体学报
Volume12Issue:7Pages:435
metadata_83中科院半导体所
Subject Area半导体物理
Indexed ByCSCD
Language中文
CSCD IDCSCD:140085
Date Available2010-11-23
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Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/20349
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
高维滨. Si晶格常数超高精度传递测量中的标准晶体及制备[J]. 半导体学报,1991,12(7):435.
APA 高维滨.(1991).Si晶格常数超高精度传递测量中的标准晶体及制备.半导体学报,12(7),435.
MLA 高维滨."Si晶格常数超高精度传递测量中的标准晶体及制备".半导体学报 12.7(1991):435.
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