SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
AlxCa(1-x)As俄歇灵敏度因子的测定
陈维德; 崔玉德
1994
Source Publication物理学报
Volume43Issue:4Pages:673
metadata_83中科院半导体所
Subject Area半导体材料
Indexed ByCSCD
Language中文
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/19907
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
陈维德,崔玉德. AlxCa(1-x)As俄歇灵敏度因子的测定[J]. 物理学报,1994,43(4):673.
APA 陈维德,&崔玉德.(1994).AlxCa(1-x)As俄歇灵敏度因子的测定.物理学报,43(4),673.
MLA 陈维德,et al."AlxCa(1-x)As俄歇灵敏度因子的测定".物理学报 43.4(1994):673.
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