SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
一个检测半导体激光器质量的有效方法
石家纬; 金恩顺; 李红岩; 李正庭; 郭树旭; 高鼎三; 余金中; 郭良
1996
Source Publication半导体学报
Volume17Issue:8Pages:595
Abstract对一百支PBC结构的InGaAsP/InP激光器的检测表明,通过变温的电导数及热阻测试给出的参数及参数随温度的变化可对半导体激光器有效地进行质量评价和可靠性筛选.
metadata_83吉林大学电子工程系;中科院半导体所
Subject Area半导体器件
Indexed ByCSCD
Language中文
CSCD IDCSCD:321274
Date Available2010-11-23
Citation statistics
Cited Times:3[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/19635
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
石家纬,金恩顺,李红岩,等. 一个检测半导体激光器质量的有效方法[J]. 半导体学报,1996,17(8):595.
APA 石家纬.,金恩顺.,李红岩.,李正庭.,郭树旭.,...&郭良.(1996).一个检测半导体激光器质量的有效方法.半导体学报,17(8),595.
MLA 石家纬,et al."一个检测半导体激光器质量的有效方法".半导体学报 17.8(1996):595.
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