Knowledge Management System Of Institute of Semiconductors,CAS
Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry | |
Ma WQ(马文全)![]() ![]() ![]() ![]() ![]() | |
1998 | |
Source Publication | 半导体学报
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Volume | 19Issue:1Pages:61 |
metadata_83 | 中科院半导体所 |
Subject Area | 光电子学 |
Indexed By | CSCD |
Language | 中文 |
CSCD ID | CSCD:423656 |
Date Available | 2010-11-23 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/19213 |
Collection | 中国科学院半导体研究所(2009年前) |
Recommended Citation GB/T 7714 | Ma WQ,Wang YT,Zhuang Y,et al. Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry[J]. 半导体学报,1998,19(1):61. |
APA | 马文全.,王玉田.,庄岩.,江德生.,朱洪亮.,...&王圩.(1998).Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry.半导体学报,19(1),61. |
MLA | 马文全,et al."Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry".半导体学报 19.1(1998):61. |
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5690.pdf(299KB) | 限制开放 | -- | Application Full Text |
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