SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry
Ma WQ(马文全); Wang YT(王玉田); Zhuang Y(庄岩); Jiang DS(江德生); Zhu HL(朱洪亮); Zhang JY(张静媛); Duan LH(段俐宏); Wang W(王圩)
1998
Source Publication半导体学报
Volume19Issue:1Pages:61
metadata_83中科院半导体所
Subject Area光电子学
Indexed ByCSCD
Language中文
CSCD IDCSCD:423656
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/19213
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Ma WQ,Wang YT,Zhuang Y,et al. Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry[J]. 半导体学报,1998,19(1):61.
APA 马文全.,王玉田.,庄岩.,江德生.,朱洪亮.,...&王圩.(1998).Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry.半导体学报,19(1),61.
MLA 马文全,et al."Suructural investigation of InGaAs/InP quantum wire array using triple-axis X-ray diffractometry".半导体学报 19.1(1998):61.
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