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分子束外延InAs量子点材料的透射电子显微镜研究
白元强; 莫庆伟; 范缇文
1999
Source Publication北京科技大学学报
Volume21Issue:2Pages:182
Abstract报道了利用分子束外延技术在(001)GaAs衬底上生长的单层及多层InAs量子点材料的透射电子显微镜(TEM)研究结果,并对量子点的结构特性进行邓讨论。结果表明
metadata_83北京科技大学材料科学与工程学院;中科院半导体所
Subject Area半导体材料
Funding Organization国家自然科学基金
Indexed ByCSCD
Language中文
CSCD IDCSCD:536724
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/18595
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
白元强,莫庆伟,范缇文. 分子束外延InAs量子点材料的透射电子显微镜研究[J]. 北京科技大学学报,1999,21(2):182.
APA 白元强,莫庆伟,&范缇文.(1999).分子束外延InAs量子点材料的透射电子显微镜研究.北京科技大学学报,21(2),182.
MLA 白元强,et al."分子束外延InAs量子点材料的透射电子显微镜研究".北京科技大学学报 21.2(1999):182.
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