SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
双采样技术在三阶sigma-delta调制器中的应用
毕卓; 石寅
2000
Source Publication电路与系统学报
Volume5Issue:4Pages:17
metadata_83中科院半导体所
Subject Area微电子学
Indexed ByCSCD
Language中文
CSCD IDCSCD:563023
Date Available2010-11-23
Citation statistics
Cited Times:1[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/18581
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
毕卓,石寅. 双采样技术在三阶sigma-delta调制器中的应用[J]. 电路与系统学报,2000,5(4):17.
APA 毕卓,&石寅.(2000).双采样技术在三阶sigma-delta调制器中的应用.电路与系统学报,5(4),17.
MLA 毕卓,et al."双采样技术在三阶sigma-delta调制器中的应用".电路与系统学报 5.4(2000):17.
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