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EBIC测定GaPLPE样片的少子扩散长度
李永良; 杨锡震; 周燕; 李承基; 李蕴言
2000
Source Publication电子显微学报
Volume19Issue:4Pages:581
metadata_83北京师范大学分析测试中心;中科院;中国科学院半导体研究所
Subject Area半导体材料
Indexed ByCSCD
Language中文
CSCD IDCSCD:581103
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/18545
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
李永良,杨锡震,周燕,等. EBIC测定GaPLPE样片的少子扩散长度[J]. 电子显微学报,2000,19(4):581.
APA 李永良,杨锡震,周燕,李承基,&李蕴言.(2000).EBIC测定GaPLPE样片的少子扩散长度.电子显微学报,19(4),581.
MLA 李永良,et al."EBIC测定GaPLPE样片的少子扩散长度".电子显微学报 19.4(2000):581.
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