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用X射线双晶衍射方法测定GaMnAs组分 | |
陈诺夫; 修慧欣; 杨君玲; 吴金良; 钟兴儒; 林兰英 | |
2001 | |
Source Publication | 科学通报
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Volume | 2035Issue:0 |
metadata_83 | 中科院半导体所 |
Subject Area | 半导体材料 |
Indexed By | CSCD |
Language | 中文 |
CSCD ID | CSCD:691945 |
Date Available | 2010-11-23 |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/18291 |
Collection | 中国科学院半导体研究所(2009年前) |
Recommended Citation GB/T 7714 | 陈诺夫,修慧欣,杨君玲,等. 用X射线双晶衍射方法测定GaMnAs组分[J]. 科学通报,2001,2035(0). |
APA | 陈诺夫,修慧欣,杨君玲,吴金良,钟兴儒,&林兰英.(2001).用X射线双晶衍射方法测定GaMnAs组分.科学通报,2035(0). |
MLA | 陈诺夫,et al."用X射线双晶衍射方法测定GaMnAs组分".科学通报 2035.0(2001). |
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