用X射线双晶衍射方法测定GaMnAs组分

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	用X射线双晶衍射方法测定GaMnAs组分
	陈诺夫; 修慧欣; 杨君玲; 吴金良; 钟兴儒; 林兰英
	2001
Source Publication	科学通报
Volume	2035 Issue:0
metadata_83	中科院半导体所
Subject Area	半导体材料
Indexed By	CSCD
Language	中文
CSCD ID	CSCD:691945
Date Available	2010-11-23
Citation statistics	Cited Times:6[CSCD] [CSCD Record]
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/18291
Collection	中国科学院半导体研究所（2009年前）
Recommended Citation GB/T 7714	陈诺夫,修慧欣,杨君玲,等. 用X射线双晶衍射方法测定GaMnAs组分[J]. 科学通报,2001,2035(0).
APA	陈诺夫,修慧欣,杨君玲,吴金良,钟兴儒,&林兰英.(2001).用X射线双晶衍射方法测定GaMnAs组分.科学通报,2035(0).
MLA	陈诺夫,et al."用X射线双晶衍射方法测定GaMnAs组分".科学通报 2035.0(2001).

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