SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
用X射线双晶衍射方法测定GaMnAs组分
陈诺夫; 修慧欣; 杨君玲; 吴金良; 钟兴儒; 林兰英
2001
Source Publication科学通报
Volume2035Issue:0
metadata_83中科院半导体所
Subject Area半导体材料
Indexed ByCSCD
Language中文
CSCD IDCSCD:691945
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/18291
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
陈诺夫,修慧欣,杨君玲,等. 用X射线双晶衍射方法测定GaMnAs组分[J]. 科学通报,2001,2035(0).
APA 陈诺夫,修慧欣,杨君玲,吴金良,钟兴儒,&林兰英.(2001).用X射线双晶衍射方法测定GaMnAs组分.科学通报,2035(0).
MLA 陈诺夫,et al."用X射线双晶衍射方法测定GaMnAs组分".科学通报 2035.0(2001).
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