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扩展OSL方法校准微波双口测试夹具
陈振宇; 王幼林; 祝宁华
2002
Source Publication电子学报
Volume30Issue:11Pages:1711-1714
Abstract常规的OSL(open-short-load)校准方法具有简便易行的特点,被广泛应用于单端口测量的测试夹具的校准。在本文中,OSL方法被首次扩展应用于双端口夹具的校准,并消除该方法带来的相位不确定问题。通过实验证明这种方法与SOLT(short-open-load-thru)方法同样精确。
metadata_83中国科学院半导体研究所
Subject Area光电子学
Funding Organization国家杰出青年科学基金(No.698251 9)
Indexed ByCSCD
Language中文
CSCD IDCSCD:1011520
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/17979
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
陈振宇,王幼林,祝宁华. 扩展OSL方法校准微波双口测试夹具[J]. 电子学报,2002,30(11):1711-1714.
APA 陈振宇,王幼林,&祝宁华.(2002).扩展OSL方法校准微波双口测试夹具.电子学报,30(11),1711-1714.
MLA 陈振宇,et al."扩展OSL方法校准微波双口测试夹具".电子学报 30.11(2002):1711-1714.
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