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980 nm半导体激光器可靠性的研究现状分析
刘斌; 张敬明; 刘媛媛; 王晓薇; 方高瞻; 马骁宇; 肖建伟
2002
Source Publication激光杂志
Volume23Issue:5Pages:1-2
Abstract本文介绍了提高980 nm半导体激光器可靠性的几种方案,并做了综合评述。进一步介绍了离子辅助镀膜技术在提高980 nm激光器可靠性方面的应用。
metadata_83中国科学院半导体研究所
Subject Area半导体器件
Indexed ByCSCD
Language中文
CSCD IDCSCD:1019081
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/17965
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
刘斌,张敬明,刘媛媛,等. 980 nm半导体激光器可靠性的研究现状分析[J]. 激光杂志,2002,23(5):1-2.
APA 刘斌.,张敬明.,刘媛媛.,王晓薇.,方高瞻.,...&肖建伟.(2002).980 nm半导体激光器可靠性的研究现状分析.激光杂志,23(5),1-2.
MLA 刘斌,et al."980 nm半导体激光器可靠性的研究现状分析".激光杂志 23.5(2002):1-2.
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