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Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers
Han Chunlin; Liu Ruixi; Guo Weihua; Yu Lijuan; Huang Yongzhen
2003
Source Publication半导体学报
Volume24Issue:8Pages:789-793
AbstractA fitting process is used to measure the cavity loss and the quasi-Fermi-level separation for Fabry- Perot semiconductor lasers. From the amplified spontaneous emission (ASE) spectrum, the gain spectrum and single-pass ASE obtained by the Cassidy method are applied in the fitting process. For a 1550nm quantum well InGaAsP ridge waveguide laser, the cavity loss of about ~24cm~(-1) is obtained.
metadata_83school of physics science and technology, lanzhou university;institute of semiconductors, the chinese academy of sciences
Subject Area光电子学
Funding Organization国家重点基础研究发展规划资助项目(No. G2 366 5)
Indexed ByCSCD
Language英语
CSCD IDCSCD:1208344
Date Available2010-11-23
Citation statistics
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/17819
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
Han Chunlin,Liu Ruixi,Guo Weihua,et al. Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers[J]. 半导体学报,2003,24(8):789-793.
APA Han Chunlin,Liu Ruixi,Guo Weihua,Yu Lijuan,&Huang Yongzhen.(2003).Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers.半导体学报,24(8),789-793.
MLA Han Chunlin,et al."Measurement of Cavity Loss and Quasi-Fermi-Level Separation for Fabry-Perot Semiconductor Lasers".半导体学报 24.8(2003):789-793.
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